From August 8 to 10, 2020, SNEC's 14th (2020) International Solar Photovoltaic and Smart Energy (Shanghai) Exhibition and Forum (hereinafter referred to as SNEC Photovoltaic Conference and (Shanghai) Exhibition) was held in Shanghai New International Expo Center. TZTEK will bring the independently developed photovoltaic wafer detection and sorting equipment to the exhibition to discuss and solve the problem of silicon wafer quality control equipment with you!

Exhibition equipment

Photovoltaic wafer detection and sorting equipment

The TZTEK PV wafer detection and sorting equipment integrates TZTEK's more than 10 years of machine vision technology and automation experience, and introduces in-depth learning software, which can efficiently identify and sort the thickness, TTV, resistivity, line mark, side length, chamfer, diameter, verticality, parallelism, warpage, hidden crack, visible crack, impurity, perforation, missing corner, dirt, edge collapse and other characteristics of the wafer.

The equipment has fast sorting speed, good detection effect, high degree of automation and low maintenance cost, and can be widely used for product quality control of diamond, black silicon, mortar, resin and other processes.

Booth Overview

Exhibition Hall: N5

Booth No.: N5-006

TZTEK, sincerely invite you to come!